Lukyanchikova, N. R. ; Garbar, N. ; Smolanka, A. ; Simoen, E. ; Mercha, A. ; Claeys, C.
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Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.208-214, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Mercha, A. ; Simoen, E. ; Decoutere, S. ; Claeys, C.
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Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain. pp.193-207, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Pavanello, M.A. ; Martino, J.A. ; Simoen, E. ; Mercha, A. ; Clacys, C. ; van Meer, H. ; De Meyer, K.
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Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.389-394, 2003. Pennington, N.J.. Electrochemical Society
Mercha, A. ; Simoen, E. ; Rafi, J.-M. ; Clacys, C. ; Lukyanchikova, N. ; Petrichuk, M. ; Garbar, N.
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Silicon-on-insulator technology and devices XI : proceedings of the international symposium. pp.319-324, 2003. Pennington, N.J.. Electrochemical Society
Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium. pp.153-172, 2003. Pennington, N.J.. Electrochemical Society
Simoen, E. ; Rafi, J.M. ; Mercha, A. ; De Meyer, K. ; Claeys, C. ; Kokkoris, M. ; Kossionides, E. ; Fanourakis, G. ; Mohhaindzadeh, A.
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Microelectronics technology and devices : SBMICRO 2003 : proceedings of the eighteenth international symposium. pp.18-27, 2003. Pennington, N.J.. Electrochemical Society
Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah. pp.420-439, 2003. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Simoen, E. ; Hayama, K. ; Takakura, K. ; Mercha, A. ; Claeys, C. ; Ohyama, H.
Pub. info.:
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.455-463, 2005. Pennington, N.J.. Electrochemical Society
Microelectronics technology and devices : SBMICRO 2005 : proceedings of the twentieth international symposium. pp.3-15, 2005. Pennington, N.J.. Electrochemical Society