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Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.59651U-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Guenster, S. ; Blaschke, H. ; Ristau, D. ; Danailov, M. ; Trovo, M. ; Gatto, A. ; Kaiser, N. ; Sarto, F. ; Flori, D. ; Menchini, F.
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Advances in optical thin films : 30 September-3 October 2003, St. Etienne, France. pp.146-157, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering