Bassman, L. C. ; Vinci, R. P. ; Shieh, B. P. ; Kim, D-K. ; McVittie, J. P. ; Saraswat, K. C. ; Deal, M. D.
Pub. info.:
Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A.. pp.323-, 1997. Pittsburgh, Pa.. MRS - Materials Research Society