1.

Conference Proceedings
Conference Proceedings
1. Comparison of Pd/Sn and Pd/Sn/Au Thin-Film Systems for Device Metallization
Islam, M. S. ; McNally, Patrick J. ; Cameron, D. C. ; Herbert, P. A. F.
Pub. info.: Advanced metallization for future ULSI : symposium held April 8-11, 1996, San Francisco, California, U.S.A..  pp.583-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 427
2.

Conference Proceedings
Conference Proceedings
2. The Use of X-ray Topography to Map Mechanical, Thermomechanical, and Wire-Bond Strain Fields in Packaged Integrated Circuits
McNally, Patrick J. ; Rantamaki, R. ; Curley, John W. ; Tuomi, T. ; Danilewsky, A. N. ; Herbert, P. A. F.
Pub. info.: Thin-films : stresses and mechanical properties VII : symposium held December 1-5, 1997, Boston, Massachusetts, U.S.A..  pp.241-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 505
3.

Conference Proceedings
Conference Proceedings
3. Structural and Compositional Evolution of Self-Assembled Germanium Islands on Silicon (001) During High Growth Rate LPCVD
Dilliway, Gabriela D. M. ; Cowern, Nicholas E. B. ; Jeynes, Chris ; O'Reilly, Lisa ; McNally, Patrick J. ; Bagnall, Darren M.
Pub. info.: Self-assembled nanostructured materials : symposium held April 22-25, 2003, San Francisco, California, U.S.A..  pp.275-280,  2003.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 775
4.

Conference Proceedings
Conference Proceedings
4. Influence of H2 Preconditioning on the Nucleation and Growth of Self-Assembled Germanium Islands on Silicon (001)
Dilliway, Gabriela D.M. ; Cowern, Nicholas E.B. ; Xu, Lu ; McNally, Patrick J. ; Jeynes, Chris ; Mendoza, Emest ; Ashburn, Peter ; Bagnall, Darren M.
Pub. info.: Nanoengineered assemblies and advanced micro/nanosystems : symposium held April 13-16, 2004, San Francisco, California, U.S.A..  pp.351-356,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 820
5.

Conference Proceedings
Conference Proceedings
5. Non-Destructive Measurement of Deep Embedded Defects in Silicon Using Photoacoustic Microscope (PAM)
Xu, Lu ; Lowney, Donnacha ; McNally, Patrick J. ; Gomez Fernandex, Eva ; Stopford, Jennifer
Pub. info.: Materials, technology and reliability of low-k dielectrics and copper interconnects : symposium held April 18-21, 2006, San Francisco, California, U.S.A..  pp.451-456,  2006.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 914