1.

Conference Proceedings
Conference Proceedings
1. STUDY OF THE METAMICT TRANSFORMATION IN ALPHA-QUARTZ USING HIGH-RESOLUTION LATTICE IMAGING AND CONVERGENT BEAM ELECTRON DIFFRACTION
Pascucci, M. R. ; Hutchison, J. L. ; McKernan, S. ; Eades, J. A. ; Hobbs, L. W.
Pub. info.: Scientific basis for nuclear waste management : proceedings of the Materials Research Society Annual Meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.689-696,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 6
2.

Conference Proceedings
Conference Proceedings
2. DISLOCATIONS IN GaAs/Si INTERFACES
Zhu, Jane G. ; McKernan, S. ; Carter, C. B. ; Schaff, W. J. ; Eastman, L. F.
Pub. info.: Advances in materials, processing, and devices in III-V compound semiconductors.  pp.285-290,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 144
3.

Conference Proceedings
Conference Proceedings
3. DEFECTS AND INTERFACES IN GaAs GROWN ON Si
McKernan, S. ; Zhu, J.G. ; Carter, C.B. ; Caridi, E. ; Schaff, W.
Pub. info.: Heteroepitaxy on silicon : fundamentals, structure, and devices : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.273-278,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 116
4.

Conference Proceedings
Conference Proceedings
4. A STUDY OF DEFECTS IN ORDERED TERNARY SEMICONDUCTOR EPILAYERS
McKernan, S. ; Carter, C.B. ; Bour, D.P. ; Shealy, J.R.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.111-116,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
5.

Conference Proceedings
Conference Proceedings
5. HIGH-RESOLUTION MICROSCOPY OF CERAMICS
Carter, C.B. ; McKernan, S. ; Rasmussen, D.R. ; Simpson, Y.K. ; Summerfelt, S.R. ; Susnitzky, D.W. ; Tietz, L.A.
Pub. info.: High resolution microscopy of materials : symposium held November 29-December 1, 1988, Boston, Massachusetts, U.S.A..  pp.189-198,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 139
6.

Conference Proceedings
Conference Proceedings
6. THE STUDY OF INTERFACES IN GaAs
Cho, N.-H. ; Rasmussen, D.R. ; McKernan, S. ; Carter, C.B. ; Wagner, D.K.
Pub. info.: Interfacial structure, properties, and design : symposium held April 5-8, 1988, Reno, Nevada, U.S.A..  pp.33-38,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 122
7.

Conference Proceedings
Conference Proceedings
7. IMAGING OF III-V COMPOUND SUPERLATICES BY HREM AND REM
De Cooman, B.C. ; Conner, J.R. ; Summerfelt, S.R. ; McKernan, S. ; Carter, C.B. ; Shealy, J.R.
Pub. info.: Interfaces, superlattices, and thin films : symposium held December 1-6, 1986, Boston, Massachusetts, U.S.A..  pp.187-192,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 77
8.

Conference Proceedings
Conference Proceedings
8. TEM STUDIES OF ORDERING IN MOCVD-GROWN (GaIn)P ON GaAs
McKernan, S. ; De Cooman, B. C. ; Carter, C. B. ; Bour, D. P. ; Shealy, J. R.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.637-640,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
9.

Conference Proceedings
Conference Proceedings
9. INTERFACE DEFECTS IN GaAs AND GaAs-AlXGa1-XAs GROWN ON Ge
Cho, N. -H. ; McKernan, S. ; Wagner, D. K. ; Carter, C. B.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.617-622,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
10.

Conference Proceedings
Conference Proceedings
10. Formation and characterization of single crystal Ni2MnGa thin films
Dong, J. W. ; Chen, L. C. ; McKernan, S. ; Xie, J. Q. ; Figus, M. T. ; James, R. D. ; Palmstrom, C. J.
Pub. info.: Materials for smart systems III : symposium held November 30-December 2, 1999, Boston, Massachusetts, U.S.A..  pp.297-,  2000.  Pittsburgh, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 604