1.

Conference Proceedings

Conference Proceedings
Roitman, P. ; Mayo, S. ; Simons, D. ; Krause, S.J. ; Venables, D. ; Park, J.C. ; Lee, J.D. ; Lenahan, P. ; Conley, J.
Pub. info.: Proceedings of the Sixth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.92-97,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-11
2.

Conference Proceedings

Conference Proceedings
Mayo, S. ; Miller, P. ; Wilkins, S. W. ; Gao, D. ; Gureyev, T.
Pub. info.: Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA.  pp.63181E-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6318
3.

Conference Proceedings

Conference Proceedings
Mayo, S. ; Lowney, J. R. ; Bell, M. T.
Pub. info.: Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A..  pp.297-308,  1985.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 46