1.

Conference Proceedings

Conference Proceedings
Vorobjev,L.E. ; Firsov,D.A. ; Shalygin,V.A. ; Tulupenko,V.N. ; Shernyakov,Yu.M. ; Egorov,A.Yu. ; Zhukov,A.E. ; Kovsh,A.R. ; Kop'ev,P.S. ; Kochnev,I.V. ; Ledentsov,N.N. ; Maximov,M.V. ; Ustinov,V.M. ; Alferov,Zh.I.
Pub. info.: Fourth International Conference on Material science and material properties for infrared optoelectronics : 29 September-2 October 1998, Kiev, Ukraine.  pp.27-34,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3890
2.

Conference Proceedings

Conference Proceedings
Holst,J. ; M.Straヲツburg ; Ledentsov,N.N. ; Eckey,L. ; Goldner,A. ; Hoffmann,A. ; Hempel,T. ; Rudloff,D. ; Bertram,F. ; Christen,J. ; Sakharov,A.V. ; Maximov,M.V. ; Usikov,A.S. ; Lundin,W.V. ; Alferov,Z.I.
Pub. info.: Silicon carbide, III-nitrides and related materials, ICSCIII-N'97 : proceedings of the International Conference on Silicon Carbide, III-Nitrides and Related Materials, Stockholm, Sweden, September 1997.  Part2  pp.1291-1294,  1998.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 264-268
3.

Conference Proceedings

Conference Proceedings
Vorobjev,L.E. ; Firsov,D.A. ; Shalygin,V.A. ; Tulupenko,V.N. ; Shernyakov,Yu.M. ; Egorov,A.Yu. ; Zhukov,A.E. ; Kovsh,A.R. ; Kop'ev,P.S. ; Kochnev,I.V. ; Ledentsov,N.N. ; Maximov,M.V. ; Ustinov,V.M. ; Alferov,Zh.I.
Pub. info.: Ultrafast phenomena in semiconductors : proceedings of the 10th International Symposium on Ultrafast Phenomena in Semiconductors (10-UFPS), held in Vilnius, Lithuania, August/September, 1998.  pp.189-196,  1999.  Zurich-Uetikon, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 297-298
4.

Conference Proceedings

Conference Proceedings
Sobolev,M.M. ; Kovsh,A.R. ; Ustinov,V.M. ; Egorov,A.Yu. ; Zhukov,A.E. ; Maximov,M.V. ; Ledentsov,N.N.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1619-1624,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263