Physics and simulation of optoelectronic devices VII : 25-29 January 1999, San Jose, USA. pp.803-810, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
In-plane semiconductor lasers III : 27-29 January 1999, San Jose, California. pp.228-236, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared. pp.82-86, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
In-Plane Semiconductor Lasers: from Ultraviolet to Midinfrared. pp.7-12, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Applications of Optoelectronic Devices. pp.69-76, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Testing, Reliability, and Applications of Optoelectronic Devices. pp.134-145, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
In-Plane Semiconductor Lasers: from Ultraviolet to Mid-Infrared II. pp.2-10, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering