Kubota, H. ; Numano, M. ; Amai, T. ; Miyashita, M. ; Samata, S. ; Matsushita, Y.
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Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology. pp.225-236, 1994. Pennington, NJ. Electrochemical Society
Matsushita, Y. ; Sanada, M. ; Tanabe, A. ; Takeda, R. ; Shimaoi, N. ; Kobayashi, K.
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Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.683-697, 1998. Pennington, NJ. Electrochemical Society
Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.1459-1465, 1998. Pennington, NJ. Electrochemical Society
Fisher, I. R. ; Matsushita, Y. ; Bluhm, H. ; Geballe, T. H.
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Strongly correlated electron materials : physics and nanoengineering : 31 July-4 August, 2005, San Diego, California, USA. pp.59321Y-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Ueda, Y. ; Nakata, T. ; Koga, K. ; Matsushita, Y. ; Fujikawa, Y. ; Uetani, T. ; Yamaguchi, T. ; Niina, T.
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Diamond, silicon carbide, and related wide bandgap semiconductors : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A.. pp.427-432, 1990. Pittsburgh, Pa.. Materials Research Society
Fujimori, H. ; Ushiku, Y. ; Ihnuma, T. ; Kirino, Y. ; Matsushita, Y.
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Silicon materials science and technology : proceedings of the Eighth International Symposium on Silicon Materials Science and Technology. pp.1033-1044, 1998. Pennington, NJ. Electrochemical Society
Proceedings of the Symposium on Contamination Control and Defect Reduction in Semiconductor Manufacturing II. pp.202-210, 1994. Pennington, NJ. Electrochemical Society
Samata, S. ; Numano, M. ; Amai, T. ; Matsushita, Y. ; Kobayashi, K. ; Yamamoto, A. ; Kawaguchi, T. ; Nadahara, S. ; Yamabe, K.
Pub. info.:
Proceedings of the Symposium on the Degradation of Electronic Devices due to Device Operation as well as Crystalline and Process-Induced Defects. pp.101-110, 1994. Pennington, NJ. Electrochemical Society