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91 results

Conference Proceedings

1. ELECTROLUMINESCENCE FROM μc-SiC/POROUS Si PN JUNCTIONS

Mimura, H. ; Futagi, T. ; Matsumoto, T. ; Ohta, Y. ; Kitamura, K. ; Kanemitsu, Y.

Pub. info.:	Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.. pp.385-390, 1993. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	298

Conference Proceedings

2. VISIBLE PHOTOLUMINESCENCE FROM POROUS SILICON CARBIDE

Matsumoto, T. ; Tamaki, T. ; Futagi, T. ; Mimura, H. ; Kanemitsu, Y.

Pub. info.:	Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A.. pp.355-360, 1993. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	298

Conference Proceedings

3. VISIBLE ELECTROLUMINESCENCE FROM PN JUNCTION TYPE μc-SiC/POROUS Si/c-Si STRUCTURES

Futagi, T. ; Matsumoto, T. ; Katsuno, M. ; Ohta, Y. ; Mimura, H. ; Kitamura, K.

Pub. info.:	Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.389-394, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	283

Conference Proceedings

4. PHOTOCHEMICAL ETCHING EFFECTS ON OPTICAL PROPERTIES OF POROUS SILICON

Kanemitsu, Y. ; Uto, H. ; Masumoto, Y. ; Matsumoto, T. ; Futagi, T. ; Mimura, H.

Pub. info.:	Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.221-226, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	283

Conference Proceedings

5. Clear focusing of light in photonic crystal superlens [6352-41]

Eom, K. ; Matsumoto, T. ; Baba, T.

Pub. info.:	Optoelectronic materials and devices : 5-7 September, 2006, Gwangju, South Korea. pp.635212-635212, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6352

Conference Proceedings

6. PICOSECOND DECAY DYNAMICS IN POROUS SILICON

Matsumoto, T. ; Futagi, T. ; Mimura, H. ; Kanemitsu, Y.

Pub. info.:	Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A.. pp.149-154, 1993. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	283

Conference Proceedings

7. Dynamic phase measurement of large deformation with speckle intererometry

Matsumoto, T. ; Kitagawa, Y. ; Adachi, M.

Pub. info.:	Optomechatronic systems III : 12-14 November 2002, Stuttgart, Germany. pp.571-575, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4902

Conference Proceedings

8. Mid-infrared all-sky survey with the infrared camera (IRC) on board the ASTRO-F

Ishihara, D. ; Wada, T. ; Onaka, T. ; Matsuhara, H. ; Kataza, H. ; Ueno, M. ; Fujishiro, N. ; Kim, W. ; Watarai, H. ; Uemizu, K. ; Murakami, H. ; Matsumoto, T. ; Yamamura, I.

Pub. info.:	Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.350-358, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5487

Conference Proceedings

9. The infrared camera (IRC) on board the ASTRO-F: laboratory tests and expected performance

Onaka, T. ; Fujishiro, N. ; Ihara, C. ; Ishihara, D. ; Ita, Y. ; Kataza, H. ; Kim, W. ; Matsuhara, H. ; Matsumoto, T. ; Murakami, H. ; Sakon, I. ; Uemizu, K. ; Ueno, M. ; Wada, T. ; Watarai, H.

Pub. info.:	Optical, infrared, and millimeter space telescopes : 21-25 June 2004, Glasgow, Scotland, United Kingdom. pp.338-349, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5487

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Conference Proceedings

10. Scaling Issues for Advanced SOI Devices: Gate Oxide Tunneling, Thin Buried Oxide, and Ultra-Thin Films

Pretet, J. ; Ohata, A. ; Dieudonne, F. ; Allibert, F. ; Bresson, N. ; Matsumoto, T. ; Poiroux, T. ; Jomaah, J. ; Cristoloveanu, S.

Pub. info.:	Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium. pp.476-487, 2003. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2003-2

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