Pommies, M. ; Damiani, D. ; Bertussi, B. ; Capoulade, J. ; Natoli, J. -Y. ; Piombini, H. ; Mathis, H.
Pub. info.:
Optical fabrication, testing and metrology II : 13-15 September 2005, Jena, Germany. pp.59651K-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering