1.

Conference Proceedings
Conference Proceedings
1. Influence of photoresist feature geometry on ECR plasma-etched HgCdTe trenches
Benson, J.D. ; Stoltz, A.J., Jr. ; Kaleczyc, A.W. ; Martinka, M. ; Almeida, L.A. ; Boyd, P.R. ; Dinan, J.H.
Pub. info.: Materials for infrared detectors II : 8-9 July 2002 ,Seattle, Washington, USA.  pp.129-135,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4795
2.

Conference Proceedings
Conference Proceedings
2. Growth of Improved GaAs/Si: Suppression of Volmer-Weber Nucleation for Reduced Threading Dislocation Density
Taylor, P. J. ; Jesser, W. A. ; Simonis, G. ; Chang, W. ; Lara-Taysing, M. ; Bradshaw, J. ; Clark, W. ; Martinka, M. ; Benson, J. D. ; Dinan, J. H.
Pub. info.: III-V and IV-IV materials and processing challenges for highly integrated microelectronics and optoelectronics : symposium held November 30-December 3, 1998, Boston, Massachusetts, U.S.A..  pp.39-,  1999.  Warrendale, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 535
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Conference Proceedings
Conference Proceedings
3. Spectroscopic Ellipsometry Study of HgCdTe Epilayer Surfaces During Electron Cyclotron Resonance Plasma Etching
Johnson, J. N. ; Dinan, J. H. ; Singley, K. M. ; Martinka, M. ; Johs, B.
Pub. info.: Infrared applications of semiconductors - materials, processing, and devices : symposium held December 2-5, 1996, Boston, Massachusetts, U.S.A.  pp.293-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 450