1.

Conference Proceedings
Conference Proceedings
1. Is SOI CMOS a promising technology for SOCs in high frequency range? Invited
Raynaud, C. ; Gianesello, F. ; Tinella, C. ; Flatresse, P. ; Gwoziecki, R. ; Touret, P. ; Avenier, G. ; Haendler, S. ; Gonnard, O. ; Gouget, G. ; Labourey, G. ; Pretet, J. ; Marin, M. ; Di Frenza, R. ; Axelrad, D. ; Delatte, P. ; Provins, G. ; Roux, J. ; Balossier, E. ; Vildeuil, J.C. ; Boret, S. ; Van Haaren, B. ; Chevalier, P. ; Boissonnet, L. ; Schwartzmann, T. ; Chantre, A. ; Gloria, D. ; De Foucauld, E. ; Scheer, P. ; Pavageau, C. ; Dambrine, G.
Pub. info.: Silicon-on-insulator technology and devices XII : proceedings of the international symposium.  pp.331-344,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-03
2.

Technical Paper
Technical Paper
2. A distributed Environment for Spaceports.
Rabelo, L. ; Sepulveda, J. ; Marin, M. ; Park, J.
Pub. info.: 2004 World Aviation Congress and Exposition : SAE technical paper.  2004.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2004
3.

Technical Paper
Technical Paper
3. Data Mining and Complex Problems: Case Study in Composite Materials.
Rabelo, L. ; Marin, M. ; Huddleston, L.
Pub. info.: 2009 Aerotech Congress & Exhibition : SAE technical paper.  2009.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2009
4.

Technical Paper
Technical Paper
4. Workforce Enterprise Modeling.
Marin, M. ; Zhu, Y. ; Meade, P. ; Sargent, M. ; Warren, J.
Pub. info.: 2007 Aerotech Congress & Exhibition : SAE technical paper.  2007.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2007
5.

Conference Proceedings
Conference Proceedings
5. Effects of body biasing on the low-frequency noise of NMOSFETs from a 130-nm CMOS technology
Marin, M. ; Deen, M.J. ; de Murcia, M. ; Llinares, P. ; Vildeuil, J.C.
Pub. info.: Noise in Devices and Circuits.  pp.56-65,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113
6.

Conference Proceedings
Conference Proceedings
6. Impact of scaling down on 1/f noise in MOSFETs
Valenza, M. ; Hoffmann, A. ; Laigle, A. ; Rigaud, D. ; Marin, M.
Pub. info.: Noise in Devices and Circuits.  pp.29-43,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5113