1.

Conference Proceedings
Conference Proceedings
1. Preparation of CuInSe2 thin films by pulsed-laser ablation technique using CuInSe2 bulk crystal targets (Invited Paper)
Ando,S. ; Endo,S. ; Makita,Y. ; Tsukamoto,T.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.156-168,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550
2.

Conference Proceedings
Conference Proceedings
2. Growth and characterization of ~-FeSi2 thin films prepared by laser ablation method (Invited Paper)
Kakemoto,H. ; Makita,Y. ; Sakuragi,S. ; Show,Y. ; Izumi,T. ; Sakata,I. ; Obara,A. ; Kobayashi,N. ; Ando,S. ; Tsukamoto,T.
Pub. info.: Laser processing of materials and industrial applications II : 16-19 September 1998, Beijing, China.  pp.129-140,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3550
3.

Conference Proceedings
Conference Proceedings
3. Structural and optical properties of B-FeSi2 film prepared by laser ablation method and comparison of B-FeSi2 films prepared by three different methods
Kakemoto,H. ; Makita,Y. ; Katsumata,H. ; Iida,T. ; Stauter,C. ; Obara,A. ; Shibata,H. ; Tsai,Y. ; Sakuragi,S. ; Kobayashi,N. ; Hasegawa,M. ; Uekusa,S. ; Tsukamoto,T.
Pub. info.: Laser Processing of Materials and Industrial Applications.  pp.32-43,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2888
4.

Conference Proceedings
Conference Proceedings
4. Optical properties of silicon nanocrystallites prepared by pulsed laser ablation in inert gas ambient
Yoshida,T. ; Yamada,Y. ; Takeyama,S. ; Orii,T. ; Umezu,I. ; Makita,Y.
Pub. info.: Laser Processing of Materials and Industrial Applications.  pp.6-13,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2888
5.

Conference Proceedings
Conference Proceedings
5. Low-temperature photoluminescence characterization of impurity-doped GaAs and silicides prepared by molecular beam epitaxy,high-energy ion implantation,and combined ion-beam and molecular beam epitaxy(CIBMBE)methods
Makita,Y.
Pub. info.: Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III.  pp.87-98,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2877