1.

Conference Proceedings
Conference Proceedings
1. VACANCY-TYPE DEFECTS IN ION-IMPLANTED Si STUDIED BY SLOW POSITRON BEAM
Hautojarvi, P. ; Huttunen, P. ; Makinen, J. ; Punkka, E. ; Vehanen, A.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.105-110,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
2.

Conference Proceedings
Conference Proceedings
2. SOI Wafers with Buried Cavities
Suni, T. ; Henttinen, K. ; Dekker, J. ; Luoto, H. ; Kulawski, M. ; Makinen, J. ; Mutikainen, R.
Pub. info.: Semiconductor wafer bonding : science, technology, and applications : proceedings of the international symposia.  pp.216-225,  2005.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-02
3.

Conference Proceedings
Conference Proceedings
3. Native Defects in Low Temperature GaAs and the Effect of Hydrogenation
Pritchard, R. E. ; McQuaid, S. A. ; Newman, R. C. ; Makinen, J. ; Bardeleben, H. J. von ; Missous, M.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.441-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378