1.

Conference Proceedings
Conference Proceedings
1. The role of buried oxide in the hot carrier degradation of ultra thin n-channel SOI MOSFETs
Huttner, T. ; Mahnkopf, R. ; Wurzer, H. ; Biebl, M. ; Abstreiter, G.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.277-282,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. The Role of the Si-SiO2 (CVD) Interface in Degradation Effects for High-Speed Bipolar Transistors
Lu, J.-Q. ; Schottl, S. ; Stefanov, E. ; Koch, F. ; Mahnkopf, R. ; Klose, H.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.743-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378