1.

Conference Proceedings

Conference Proceedings
Burchard,A. ; Deicher,M. ; Forkel-Wirth,D. ; HaLller,E.E. ; Magerle,R. ; Prospero,A. ; Stotzler,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1099-1104,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
2.

Conference Proceedings

Conference Proceedings
Burchard,A. ; Correia,J.G. ; Deicher,M. ; Forkel-Wirth,D. ; Magerle,R. ; Prospero,A. ; Stotzler,A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1223-1228,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Alves,E. ; Bollmann,J. ; Deicher,M. ; Carmo,M.C. ; Henry,M.O. ; Knopf,M.H.A. ; Leitao,J.P. ; Magerle,R. ; McDonagh,C.J.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.473-478,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
4.

Conference Proceedings

Conference Proceedings
Frehill,C.A. ; Henry,M.O. ; McGlynn,E. ; Daly,S.E. ; Deicher,M. ; Magerle,R. ; McGuigan,K.G. ; Safanov,A.N. ; Lightowlers,E.C.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part1  pp.521-526,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
5.

Conference Proceedings

Conference Proceedings
Magerle,R. ; Burchard,A. ; Forkel-Wirth,D. ; Deicher,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.945-950,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
6.

Conference Proceedings

Conference Proceedings
Desnica,U.V. ; Desnica-Frankovic,I.D. ; Magerle,R. ; Burchard,A. ; Deicher,M.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part3  pp.1347-1352,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
7.

Conference Proceedings

Conference Proceedings
Pfeiffer,W. ; Liszkay,L. ; Burchard,A. ; Deicher,M. ; Magerle,R. ; Ronning,C. ; Saarinen,K. ; Hautojarvi,P.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.305-310,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
8.

Conference Proceedings

Conference Proceedings
Forkel-Wirth,D. ; Achtziger,N. ; Burchard,A. ; Correia,J.C. ; Deicher,M. ; Grillenberger,J. ; Gottschalck,H. ; Licht,T. ; Magerle,R. ; Reisldhner,U. ; Rub,M. ; Toulemonde,M. ; Witthuhn,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.963-968,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
9.

Conference Proceedings

Conference Proceedings
Burchard,A. ; Deicher,M. ; Forkel-Wirth,D. ; Freidinger,J. ; Kerle,T. ; Magerle,R. ; Pfeiffer,W. ; Prost,W. ; Wellmann,P. ; Winnacker,A.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.987-991,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
10.

Conference Proceedings

Conference Proceedings
Wolf,H. ; Burchard,A. ; Deicher,M. ; Filz,T. ; Jost,A. ; Lauer,St. ; Magerle,R. ; Ostheimer,V. ; Pfeiffer,W. ; Wichert,Th.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.309-314,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201