1.

Conference Proceedings
Conference Proceedings
1. ELECTRICAL PROPERTIES OF n- AND p-TYPE In0.53Ga0.47 As LAYERS FORMED BY ION IMPLANTATION AND RAPID THERMAL (FLASH) ANNEAL
L:iu, S. G. ; Narayan, S. Y. ; Magee, C. W. ; Wu, C. P. ; Kolondra, F. ; Paczkowski, J. ; Capewell, D.
Pub. info.: Rapid thermal processing of electronic materials : symposium held April 21-23, 1987, Anaheim California, U.S.A..  pp.375-380,  1987.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 92
2.

Conference Proceedings
Conference Proceedings
2. VACANCY DIFFUSION AT POLYSILICON ENCAPSULATED GaAs SURFACES
Kavanagh, K. L. ; Magee, C. W. ; Sheets, J.
Pub. info.: Defects in electronic materials : symposium held November 30-December 3, 1987, Boston, Massachusetts, U.S.A..  pp.463-466,  1988.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 104
3.

Conference Proceedings
Conference Proceedings
3. Energetic Ion Beams in Semiconductor Processing: Summary of a DOE Panel Study
Picraux, S. T. ; Chason, E. ; Poate, J. M. ; Borland, J. O. ; Current, M. I. ; Rubia, T. Diaz de la ; Eaglesham, D. J. ; Holland, O. W. ; Law, M. E. ; Magee, C. W. ; Mayer, J. W. ; Melngailis, J. ; Tasch, A. F.
Pub. info.: Ion-solid interactions for materials modification and processing : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.859-,  1996.  Pittsburgh.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 396
4.

Conference Proceedings
Conference Proceedings
4. Secondary Ion Mass Spectrometer Design Considerations for Organic and Inorganic Analysis
Magee, C. W.
Pub. info.: Desorption mass spectrometry : are SIMS and FAB the same?.  pp.97-,  1985.  Washington, D.C..  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 291