Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.68-74, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Matsui, M. ; Machida, S. ; Mine, T. ; Hozawa, K. ; Watanabe, K. ; Goto, Y. ; Inoue, J. ; Nagaishi, H.
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Metrology, Inspection, and Process Control for Microlithography XX. pp.61521S-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Sato, H. ; Niki, N. ; Mori, K. ; Eguchi, K. ; Kaneko, M. ; Moriyama, N. ; Ohmatsu, H. ; Kakinuma, R. ; Masuda, H. ; Machida, S. ; Sasagawa, M.
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Medical Imaging 2003: PACS and Integrated Medical Information Systems: Design and Evaluation. pp.413-423, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Matsui, M. ; Machida, S. ; Todokoro, H. ; Otaka, T. ; Sugimoto, A.
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Metrology, Inspection, and Process Control for Microlithography XIX. pp.91-102, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering