1.

Conference Proceedings
Conference Proceedings
1. A SCANNING TUNNELING MICROSCOPY STUDY OF MBE-GROWN GaAs(001)-FACETED SURFACES
Maboudian, R. ; Bressler-Hill, V. ; Wang, X.-S. ; Pond, K. ; Petroff, P.M. ; Weinberg, W.H.
Pub. info.: Microcrystalline semiconductors : materials science & devices : symposium held November 30-December 4, 1992, Boston, Massachusetts, U.S.A..  pp.807-810,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 283
2.

Conference Proceedings
Conference Proceedings
2. Diamond-Like Carbon Films for Silicon Passivation in Microelectromechanical Devices
Houston, M. R. ; Howe, R. T. ; Komvopoulos, K. ; Maboudian, R.
Pub. info.: Mechanical behavior of diamond and other forms of carbon : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.391-402,  1995.  Pittsburgh.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 383
3.

Conference Proceedings
Conference Proceedings
3. Surface Engineering of Polycrystalline Silicon Microelectromechanical Systems for Fatigue Resistance
Muhlstein, C.L. ; Ashurst, W.R. ; Stach, E.A. ; Maboudian, R. ; Ritchie, R.O.
Pub. info.: BioMEMS and bionanotechnology : symposium held April 1-3, 2002, San Francisco, California, U.S.A..  pp.41-92,  2002.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 729
4.

Conference Proceedings
Conference Proceedings
4. Improved vapor-phase deposition technique for antistiction monolayers
Ashurst, R.W. ; Carraro, C. ; Chinn, J.D. ; Fuentes, V. ; Kobrin, B. ; Maboudian, R. ; Nowak, R. ; Yi, R.
Pub. info.: Micromachining and Microfabrication Process Technology IX.  pp.204-211,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5342
5.

Conference Proceedings
Conference Proceedings
5. Molecular vapor deposition (MVD) for improved SAM coatings
Kobrin, B. ; Chinn, J. ; Ashurst, R.W. ; Maboudian, R.
Pub. info.: Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV.  pp.151-157,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5716