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27 results

Conference Proceedings

1. Non-Contact Characterization of Ultrathin Dielectrics for the Gigabit Era*

Roy,P.K. ; Chacon,C. ; Ma,Y. ; Kizilyalli,I.C. ; Horner,G.S. ; Verkuil,R.L. ; Miller,T.G.

Pub. info.:	Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices. pp.280-294, 1997. Pennington, NJ. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3322

Conference Proceedings

2. Multisensor distributed extended Kalman filtering algorithm and its application to radar/IR target tracking

Cui,N. ; Xie,W. ; Yu,X. ; Ma,Y.

Pub. info.:	Acquisition, tracking, and pointing XI : 23-24 April 1997, Orlando, Florida. pp.323-330, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3086

Conference Proceedings

3. Four-unit composite thin film IR detector

Pang,Z. ; Jiang,B. ; Qi,H. ; Ma,Y.

Pub. info.:	Detectors, focal plane arrays, and applications : 4-5 November 1996, Beijing, China. pp.230-235, 1996. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2894

Conference Proceedings

4. Analysis of errors and calibration method for manufacturing multilevel diffractive optical element by ion etching

Fu,Y. ; Lu,Z. ; Ma,Y. ; Weng,Z.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.181-184, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

5. "Design, fabrication, and characterization of broadhand multilayer mirrors for EUV optics at normal incidence"

Wang,Z. ; Kun,C. ; Ma,Y. ; Chen,B. ; Cao,J. ; Zhou,Z. ; Chen,X. ; Michette,A.G.

Pub. info.:	Soft X-ray and EUV imaging systems : 3-4 August 2000, San Diego, USA. pp.83-90, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4146

Conference Proceedings

6. 18- to 20-nm broadband multilayer at normal incidence

Ke,C. ; Wang,Z. ; Ma,Y. ; Cao,J. ; Chen,X.

Pub. info.:	X-ray optics, instruments, and missions III : 27-29 March 2000, Munich, Germany. pp.354-358, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4012

Conference Proceedings

7. The Mechanical Characteristics of a Ductile Zirconia Containing 2.5% Yttria

Ma,Y. ; Sorensen,O.T. ; Langdon,T.G.

Pub. info.:	Superplasticity in advanced materials : ICSAM-94 : proceedings of the 1994 International Conference on Superplasticity in Advanced Materials (ICSAM-94), held at the Russian Academy of Administration in Moscow on May 24-26, 1994. pp.439-444, 1994. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	170-172

Conference Proceedings

8. Cavity Growth in Superplastic Materials:The Significance of Fine Grain and Nanocrystalline Structure

Ma,Y. ; Langdon,T.G.

Pub. info.:	Intergranular and interphase boundaries in materials : iib92 : proceedings of the 6th International Congress, Thessaloniki, Greece, June 21-26, 1992. pp.539-542, 1993. Aedermannsdorf, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	126-128

Conference Proceedings

9. Ultrathin oxide for sub-O.25-ｦﾌm technology in silicon ICs: impact of stacking and nitridation

Roy,P.K. ; Ma,Y.

Pub. info.:	Microelectronic Device Technology : 1-2 October 1997, Austin, Texas. pp.61-71, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3212

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Conference Proceedings

10. Failure of polymer-metal interfaces under hygrothermal loading

Tay,A.A.O. ; Ma,Y. ; Ong,S.H.

Pub. info.:	Design, Test, Integration, and Packaging of MEMS/MOEMS : 9-11 May 2000, Paris, France. pp.471-481, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4019

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