1.

Conference Proceedings
Conference Proceedings
1. A spectral-restored fusion method based on wavelet-packet transform [6419-87]
Shan, H. ; Guo, J. ; Ma, S. ; Hao, X.
Pub. info.: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.64192F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6419
2.

Conference Proceedings
Conference Proceedings
2. Phase transition in ferroelectric hemicyanine Langmuir-Blodgett multilayers
Li, S. ; Ma, S. ; Wang, W. ; Wang, G. ; Meng, X. ; Sun, J. ; Chu, J.
Pub. info.: Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA.  pp.133-139,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5564
3.

Conference Proceedings
Conference Proceedings
3. Characterization of Damage Reduction Effect from Dielectric Protective Layer by a Real-Time Plasma Charging Probe
Ma, S. ; McVittie, J.P.
Pub. info.: Proceedings of the eleventh International Symposium on Plasma Processing.  pp.185-195,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-12
4.

Conference Proceedings
Conference Proceedings
4. Holographic polymer Bragg gratings for dense wavelength division multiplexing at 1550 nm
Wang, W. ; Xu, M. ; Xia, Y. ; Chen, M. ; Liang, J. ; Ma, S.
Pub. info.: Holography, diffractive optics, and applications II : 8-11 November 2004, Beijing, China.  pp.749-756,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5636
5.

Conference Proceedings
Conference Proceedings
5. Comparison of Automated Capacitor Testing Methods for Plasma Charging Induced Damage
Abdel-Ati, W.L.N. ; Ma, S. ; Yang, T.-C. ; McVittie, J.P. ; Saraswat, K.C.
Pub. info.: ULSI science and technology, 1995 : proceedings of the Fifth International Symposium on Ultra Large Scale Integration Science and Technology.  pp.410-417,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-5
6.

Conference Proceedings
Conference Proceedings
6. Effect of Exposed Gate Oxide Edge on the Plasma Induced Damage After Charging been Eliminated
Ma, S. ; McVittie, J.P.
Pub. info.: Proceedings of the tenth symposium on plasma processing.  pp.163-172,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-20
7.

Conference Proceedings
Conference Proceedings
7. Low-complexity integer transform and high-definition coding
Ma, S. ; Fan, X. ; Gao, W.
Pub. info.: Applications of digital image processing XXVII : 2-6 August 2004, Denver, Colorado, USA.  pp.547-554,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5558
8.

Conference Proceedings
Conference Proceedings
8. Plasma Charging Damage Performance Assessment with Scaled-up Process from 200 mm to 300 mm Dielectric Etch Chambers
Ma, S. ; Bjorkman, C. ; Mays, B. ; Kropwenicki, T. ; Feng, T. ; Li, Q. ; Dadu, U. ; Chang, M. ; Shan, H.
Pub. info.: Thin film materials, processes, and reliability : proceedings of the international symposium.  pp.14-22,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-24
9.

Conference Proceedings
Conference Proceedings
9. Hydrogenated Amorphous Silicon Photodiode Technology For Advanced CMOS Active Pixel Sensor Imagers
Budrys, A. J. ; Cao, M. ; Greene, W. ; Kooi, G. ; Lin, J. ; Ma, S. ; Ray, G. W. ; Stork, H. ; Theil, J. A. ; Yoon, U.
Pub. info.: Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A..  pp.A14.3-,  2001.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 609
10.

Conference Proceedings
Conference Proceedings
10. Characterization of Plasma Surface Charging Using a Real- Time On-Wafer Probe
Ma, S. ; McVittie, J.
Pub. info.: Proceedings of the Symposium on Process control, Diagnostics, and Modeling in Semiconductor Manufacturing.  pp.401-411,  1995.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 95-2