1.

Conference Proceedings
Conference Proceedings
1. Impact of Halo Implantation on the Lifetime Assessment in Partially Depleted SOI Transistors
M. Galeti ; J. A. Martino ; E. R. Simoen ; C. L. Claeys
Pub. info.: High purity silicon 9.  pp.351-360,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(4)
2.

Conference Proceedings
Conference Proceedings
2. Improved Model to Determine the Generation Lifetime in Short Channel SOI nMOSFETs
M. Galeti ; J. A. Martino ; E. Simoen ; C. Claeys
Pub. info.: Silicon-on-insulator technology and devices 13.  pp.387-392,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 6(4)
3.

Conference Proceedings
Conference Proceedings
3. Improved Model to Determine the Generation Lifetime in Double Gate SOI nMOSFETs
M. Galeti ; J. A. Martino ; E. Simoen ; C. Claeys
Pub. info.: Microelectronics Technology and Devices : SBMICRO 2007.  pp.343-352,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 9(1)