1.

Conference Proceedings
Conference Proceedings
1. Electrical Activity of Dislocations and Defects in Strained Si and Ge Based Devices
E.R. Simoen ; G. Eneman ; P. Verheyen ; R. Loo ; M. Bargallo Gonzalez
Pub. info.: SiGe, Ge, and Related Compounds 3: Materials, Processing, and Devices.  pp.513-527,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(10)
2.

Conference Proceedings
Conference Proceedings
2. Electrical Performance and Reliability Aspects of Strain Engineered Deep Submicron CMOS Technologies
C. Claeys ; G. Eneman ; M. Bargallo Gonzalez ; S. Put ; E. Simoen
Pub. info.: 2007 International Conference on Semiconductor Technology for Ultra Large Scale Integrated Circuits and Thin Film Transistors (ULSIC vs. TFT).  pp.15-22,  2007.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 8(1)