1.

Conference Proceedings

Conference Proceedings
Y. Yamamoto ; M. Asano ; H. Yoshida ; M. Kobayashi ; H. Toda
Pub. info.: Aluminium Alloys 2014 - ICAA14 : Selected, peer reviewed papers from the 14th International Conference on Aluminium Alloys (ICAA14), June 15-19, 2014, Trondheim, Norway.  pp.325-330,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 794-796
2.

Conference Proceedings

Conference Proceedings
M. Asano ; T. Nakamura ; H. Yoshida
Pub. info.: Aluminium Alloys 2014 - ICAA14 : Selected, peer reviewed papers from the 14th International Conference on Aluminium Alloys (ICAA14), June 15-19, 2014, Trondheim, Norway.  pp.425-430,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 794-796
3.

Conference Proceedings

Conference Proceedings
H. Nakanishi ; M. Asano ; H. Yoshida
Pub. info.: Aluminium Alloys 2014 - ICAA14 : Selected, peer reviewed papers from the 14th International Conference on Aluminium Alloys (ICAA14), June 15-19, 2014, Trondheim, Norway.  pp.572-577,  2014.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 794-796
4.

Conference Proceedings

Conference Proceedings
T. Yamaki ; Y. Kozone ; A. Hiroki ; M. Asano ; H. Kubota ; M. Yoshida
Pub. info.: Proton exchange membrane fuel cells 6.  pp.103-112,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(1)
5.

Conference Proceedings

Conference Proceedings
K. Kawano ; M. Asano ; S. Tanaka ; T. Iwamatsu ; H. Sato
Pub. info.: Photomask and X-ray mask technology II : 20-21 April 1995, Kawasaki City, Kanagawa, Japan.  pp.348-355,  1995.  Bellingham, WA.  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2512
6.

Conference Proceedings

Conference Proceedings
M. Asano ; M. Satake ; S. Tanaka ; S. Mimotogi
Pub. info.: Metrology, inspection, and process control for microlithography XXI.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6518
7.

Conference Proceedings

Conference Proceedings
S. Mimotogi ; F. Uesawa ; M. Tominaga ; H. Fujise ; K. Sho ; M. Katsumata ; H. Hane ; A. Ikegami ; S. Nagahara ; T. Ema ; M. Asano ; H. Kanai ; T. Kimura ; M. Iwai
Pub. info.: Optical microlithography XX.  2007.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6520
8.

Conference Proceedings

Conference Proceedings
T. Ikeda ; M. Asano
Pub. info.: Metrology, inspection, and process control for microlithography XXII.  1  pp.692214-1-692214-8,  2008.  Bellingham, Wash..  Society of Photo-optical Instrumentation Engineers
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6922