Cheng, K. ; Lee, J. ; Lyding, J. W. ; Salemink, H. W. M.
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Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A26.8-, 2001. Warrendale. Materials Research Society
Reuter, E. E. ; Gu, S. Q. ; Bohn, P. W. ; Dorsten, J. F. ; Abeln, G. C. ; Lyding, J. W. ; Bishop, S. G.
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Materials - fabrication and patterning at the nanoscale : Symposium held April 19-20, 1995, San Francisco, California, USA. pp.119-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Lyding, J. W. ; Shen, T. -C. ; Abeln, G. C. ; Wang, C. ; Foley, E. T. ; Tucker, J. R.
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Materials - fabrication and patterning at the nanoscale : Symposium held April 19-20, 1995, San Francisco, California, USA. pp.187-, 1995. Pittsburgh, PA. MRS - Materials Research Society
Sengupta, D. K. ; Malin, J. I. ; Jackson, S. L. ; Fang, W. ; Wu, W. ; Kuo, H. C. ; Rowe, C. ; Chuang, S. L. ; Hsieh, K. C. ; Tucker, J. R. ; Lyding, J. W. ; Feng, M. ; Stillman, G. E. ; Liu, H. C.
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Compound semiconductor electronics and photonics : symposium held April 8-10, 1996, San Francisco, California, U.S.A.. pp.203-, 1996. Pittsburgh, Penn. MRS - Materials Research Society
Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A.. pp.301-, 1998. Warrendale, Pa. MRS - Materials Research Society
Lyding, J. W. ; Lee, J. ; Cheng, K. ; Albrecht, P. M. ; Ruppalt, L. B. ; Hess, K.
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Crystalline defects and contamination: their impact and control in device manufacturing IV : DECON 2005 : proceedings of the Satellite Symposium to ESSDERC 2005, Grenoble, France. pp.135-143, 2005. Pennington, N.J.. Electrochemical Society