Machine vision applications in industrial inspection XI :proceedings of electronic imaging science and technology 2003 : 22-24 January 2003, Santa Clara, California, USA. pp.112-117, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhang, J. ; Pan, X. ; Gao, Z. ; Shi, Q. ; Lv, G. ; Gao, W.
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Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840Y-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Zhang, J. ; Pan, X. ; Gao, Z. ; Shi, Q. ; Lv, G. ; Gao, W.
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Remote sensing and modeling of ecosystems for sustainability II : 2-3 August 2005, San Diego, California, USA. pp.58840Z-, 2005. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Remote sensing and modeling of ecosystems for sustainability III : 14-16 August 2006, San Diego, California, USA. pp.62981D-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Eco-materials processing & design VI : proceedings of the 6th International Symposium on Eco-Materials Processing & Design, January 16-18, 2005, Jinju, Korea. pp.189-192, 2005. Uetikon-Zuerich, Switzerland. Trans Tech Publications
Chen, X. ; Lv, G. ; Pan, X. ; He, L. ; Wang, H. ; Qi, J. ; Wang, G.Z.
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Remote sensing and modeling of ecosystems for sustainability : 2-4 August 2004, Denver, Colorado, USA. pp.585-592, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Medical Imaging 2004: Image Perception, Observer Performance, and Technology Assessment. pp.438-446, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering