1.

Conference Proceedings

Conference Proceedings
Chen,J.X. ; Russell,D.R. ; Terhune,R. ; Riddick,J. ; Kalk,F.D. ; Lucas,K.D. ; Falch,B.J.
Pub. info.: 19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California.  Part2  pp.626-634,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3873
2.

Conference Proceedings

Conference Proceedings
Lucas,K.D. ; Ivin,V.V. ; Kudrja,V.P. ; Larin,D.Yu. ; Makhviladze,T.M. ; Medvedeva,M.G. ; Rogov,A.A. ; Verzunov,S.V. ; Yang,D.C.
Pub. info.: Optical Microlithography IX.  Part1  pp.348-359,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2726
3.

Conference Proceedings

Conference Proceedings
Lucas,K.D. ; Yuan,C.-M. ; Strojwas,A.J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography X.  pp.436-447,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2725
4.

Conference Proceedings

Conference Proceedings
Ivin,V.V. ; Lucas,K.D. ; Makhviladze,T.M. ; Manuilov,V.V. ; Medvedeva,M.G
Pub. info.: Emerging lithographic technologies II : 23-25 February 1998, Santa Clara, California.  pp.646-654,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3331
5.

Conference Proceedings

Conference Proceedings
Li,X. ; Lucas,K.D. ; Swecker,A.L. ; Strojwas,A.J.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.717-728,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
6.

Conference Proceedings

Conference Proceedings
Ivin,V.V. ; Larin,D.Yu. ; Lucas,K.D. ; Makhviladze,T.M. ; Rogov,A.A. ; Verzunov,S.V.
Pub. info.: Optical Microlithography X.  pp.567-577,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3051
7.

Conference Proceedings

Conference Proceedings
Lucas,K.D. ; Vasquez,J.A. ; Jain,A. ; Filipiak,S.M. ; Vuong,T. ; King,C.F. ; Roman,B.J.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XI.  pp.194-204,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3050
8.

Conference Proceedings

Conference Proceedings
Kling,M.E. ; Lucas,K.D. ; Reich,A. ; Roman,B.J. ; Chuang,H. ; Gilbert,P.V. ; Grobman,W.D. ; Travis,E.O. ; Tsui,P. ; Vuong,T. ; West,J.P.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.204-214,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
9.

Conference Proceedings

Conference Proceedings
Postnikov,S.V. ; Lucas,K.D. ; Roman,B.J. ; Wimmer,K.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.901-912,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
10.

Conference Proceedings

Conference Proceedings
Sturtevant,J.L. ; Allgair,J. ; Fu,C.-C. ; Green,K.G. ; Hershey,R.R. ; Kling,M.E. ; Litt,L.C. ; Lucas,K.D. ; Roman,B.J. ; Seligman,C.S. ; Schippers,M.
Pub. info.: Optical microlithography XII : 17-19 March 1999, Santa Clara, California.  Part1  pp.220-227,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3679