Micromachining and microfabrication process technology VII : 22-24 October 2001, San Francisco, USA. pp.174-182, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Multispectral and hyperspectral image acquisition and processing : 22-24 2001, Wuhan, China. pp.369-374, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Visual information processing VII : 13-14 April 1998, Orlando, Florida. pp.360-368, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of advances in fluorescence sensing technology IV : 24-27 January 1999, San Jose, California. pp.256-264, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices III : 28-30 January 1998, San Jose, California. pp.221-226, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.419-421, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fiber optic sensors V : 6-7 November 1996, Beijing, China. pp.548-551, 1996. Bellingham, Wash. USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Fifth International Symposium on Optical Storage (ISOS 2000) : 22-26 May 2000, Shanghai, China. pp.233-236, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering