1.

Conference Proceedings

Conference Proceedings
Lopez,C. ; fabregas,F.X.
Pub. info.: SAR image analysis, modeling, and techniques III : 25-27 September 2000, Barcelona, Spain.  pp.199-210,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4173
2.

Conference Proceedings

Conference Proceedings
Rivero,C.A. ; Sharek,P.S. ; Nootz,G. ; Lopez,C. ; Richardson,K.A. ; Schulte,A. ; Irwin,R. ; Galstian,T. ; Hamel,V. ; Turcotte,K. ; Villeneuve,A. ; Valee,R.
Pub. info.: Engineering thin films with ion beams, nanoscale diagnostics, and molecular manufacturing : 30-31 July 2001, San Diego, USA.  pp.47-56,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4468
3.

Conference Proceedings

Conference Proceedings
Alen,J.M. ; Doval,A.F. ; Bugarin,J. ; Dorrio,B.V. ; Lopez,C. ; Fernandez,A. ; Blanco-Garcia,J. ; Perez-Amor,M. ; Fernandez,J.F.
Pub. info.: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.166-175,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3098
4.

Conference Proceedings

Conference Proceedings
Fernandez,A. ; Doval,A.F. ; Bugarin,J. ; Dorrio,B.V. ; Lopez,C. ; Alen,J.M. ; Blanco-Garcia,J. ; Perez-Amor,M. ; Fernandez,J.L.
Pub. info.: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.575-581,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3098
5.

Conference Proceedings

Conference Proceedings
Dorrrio,B.V. ; Lopez,C. ; Alen,J.M. ; Bugarin,J. ; Fernandez,A. ; Doval,A.F. ; Blanco-Garcia,J. ; Perez-Amor,M. ; Fernandez,J.L.
Pub. info.: Optical inspection and micromeasurements II : 16-19 June 1997, Munich, FRG.  pp.18-26,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3098
6.

Conference Proceedings

Conference Proceedings
Dorrfo,B.V. ; Lopez,C. ; Doval,A.F. ; Perez-Amor,M. ; Fernandez,J.L.
Pub. info.: Interferometry '99 : techniques and technologies : 20-23 September 1999, Pułtusk, Poland.  pp.94-100,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3744
7.

Conference Proceedings

Conference Proceedings
Dorrio,B.V. ; Blanco-Garcia,J. ; Doval,A.F. ; Lopez,C. ; Soto,R. ; Bugarin,J. ; Fernandez,J.L. ; Perez-Amor,M.
Pub. info.: Second Iberoamerican Meeting on Optics : 18-22 September 1995, Guanajuato, México.  pp.346-349,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2730
8.

Conference Proceedings

Conference Proceedings
Saliminia,A. ; Galstian,T.V. ; Villeneuve,A. ; Richardson,K.A. ; Graham,A.G. ; Lopez,C. ; Seal,S. ; Verma,D.D. ; Schulte,A.
Pub. info.: Applications of photonic technology 4 : closing the gap between theory, development, and application : Photonics North 2000.  pp.720-721,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4087
9.

Conference Proceedings

Conference Proceedings
Blanco-Garcia,J. ; Doval,A.F. ; Fernandez,A. ; Dorrio,B.V. ; Lopez,C. ; Soto,R. ; Alen,J.M. ; Fernandez,J.L. ; Perez-Amor,M.
Pub. info.: Second Iberoamerican Meeting on Optics : 18-22 September 1995, Guanajuato, México.  pp.101-105,  1996.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2730
10.

Conference Proceedings

Conference Proceedings
Dorrio,B.V. ; Bugarin,J. ; Alen,J.M. ; Fernandez,A. ; Doval,A.F. ; Lopez,C. ; Blanco-Garcia,J. ; Fernandez,J.L. ; Perez-Amor,M.
Pub. info.: Optical Inspection and Micromeasurements.  pp.258-266,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2782