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Conference Proceedings

1. A SIMPLE MODEL FOR STRESS VOIDING IN PASSIVATED THIN FILM CONDUCTORS

Lloyd, J. R ; Arzi, E.

Pub. info.:	Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.. pp.45-50, 1992. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	265

Conference Proceedings

2. QUICK TESTS FOR ELECTROMIGRATION : USEFUL BUT NOT WITHOUT DANGER

Lloyd, J. R

Pub. info.:	Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A.. pp.177-186, 1992. Pittsburgh, PA. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	265