Optical design and testing II : 8-12 November 2004, Beijing, China. pp.665-673, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Infrared components and their applications : 8-11 November 2004, Beijing, China. pp.513-519, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Liu, C. ; Xie, C. ; Huang, H. ; Wang, H. ; Han, D.
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Advances in optical data storage technology : 8-10 November, 2004, Beijing, China. pp.249-257, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Biometric technology for human identification II : 28-29 March, 2005, Orlando, Florida, USA. pp.164-172, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Li, A. ; Liu, C. ; Xie, P. ; Liu, J. ; Qin, M. ; Dou, K. ; Fang, W. ; Liu, W.
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Optical technologies for atmospheric, ocean, and environmental studies : 18-22 October 2004, Beijing, China. pp.371-378, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Microfluidics, bioMEMS, and medical microsystems III : 24-26 January 2005, San Jose, California, USA. pp.179-185, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA. pp.544-553, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering