1.

Conference Proceedings

Conference Proceedings
Pinheiro,M.V.B. ; Linde,M. ; Ohkura,H. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1085-1090,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings

Conference Proceedings
Watkins,G.D. ; Linde,M. ; Mason,P.W. ; Przybylinska,H. ; C.B0zdog ; Ufiring,S.J. ; Harle,V. ; Scholz,F. ; Choyke,W.J. ; Slack,G.A.
Pub. info.: Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997.  Part2  pp.1087-1092,  1997.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 258-263
3.

Conference Proceedings

Conference Proceedings
Linde,M. ; Alt,H.Ch. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.213-218,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings

Conference Proceedings
Linde,M. ; Pawlik,T. ; Overhof,H. ; Spaeth,J.-M.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1041-1046,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147