1.

Conference Proceedings

Conference Proceedings
Leong, M. -K. ; Lim, J. H.
Pub. info.: Applications of digital image processing XXVIII : 2-4 August 2005, San Diego, California, USA.  pp.59090P-,  2005.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5909
2.

Conference Proceedings

Conference Proceedings
Sun, X. ; Xiong, Y. N. ; Chen, P. ; Lin, J. Y. ; Ji, W. ; Lim, J. H. ; Yang, S. ; Hagan, D. J. ; Stryland, E. W. Van
Pub. info.: Thin films for optical waveguide devices and materials for optical limiting : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.233-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 597
3.

Conference Proceedings

Conference Proceedings
Tan, W. L. ; Ji, W. ; Zuo, J. L. ; Bai, J. F. ; You, X. Z. ; Lim, J. H. ; Yang, S. S. ; Hagan, D. J. ; Stryland, E. W. Van
Pub. info.: Thin films for optical waveguide devices and materials for optical limiting : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A..  pp.413-,  2000.  Warrendale, PA.  MRS-Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 597
4.

Conference Proceedings

Conference Proceedings
Kwon, Y. K. ; Kim, G.-J. ; Lim, J. H. ; Kim, D. H. ; Choi, B. D.
Pub. info.: Nanotechnology in mesostructured materials : proceedings of the 3rd International Mesostructured Materials Symposium, Jeju, Korea, July 8-11, 2002.  pp.141-144,  2003.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 146
5.

Conference Proceedings

Conference Proceedings
Nam, K. Y. ; Lim, J. H. ; Jung, Y. J. ; Kim. K. W. ; Park, J. G. ; Yoon, K. H.
Pub. info.: Penetrating Radiation Systems and Applications VII.  pp.59230U-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5923