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95 results

Conference Proceedings

1. EFFECT OF BENZOTRIAZOLE ON HIGH RATE ELECTRODISSOLUTION OF Cu, Ni, AND Cu-3ONi IN CONCENTRATED CHLORIDE SOLUTIONS

Shen, D.H. ; Li,W. ; Nobe, K.

Pub. info.:	Proceedings of the Second International Symposium on Corrosion and Reliability of Electronic Materials and Devices. pp.74-85, 1993. Pennington, NJ. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	1993-1

Conference Proceedings

2. Ultrafast x-ray absorption spectroscopy: observing the equilibrium structure and structural dynamics of solvated molecules

Jiang,Y. ; Li,W. ; Cao,G. ; Lee,T. ; Ketwaroo,G. ; Rose-Petruck,C.G.

Pub. info.:	Applications of X rays generated from lasers and other bright sources II : 30-31 July 2001, San Diego, USA. pp.42-48, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4504

Conference Proceedings

3. New fast license plate location method

Li,W. ; Huang,X. ; Wang,M. ; Chen,X.

Pub. info.:	Image compression and encryption technologies : 22-24 October 2001, Wuhan, China. pp.220-224, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4551

Conference Proceedings

4. Vibration measurements using CCD

Wang,Q. ; He,L. ; Guo,Q. ; Li,W.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.339-343, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

5. Detection of objects buried in soil using microwave heating

DiMarzio,C.A. ; Oktar,T. ; Li,W. ; Rappaport,C.M.

Pub. info.:	Environmental monitoring and remediation technologies II : 20-22 September, 1999, Boston, Massachusetts. pp.311-320, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3853

Conference Proceedings

6. Practical coordinate mapping method for phase-measuring profilometry

Li,W. ; Su,X. ; Su,L. ; Xiang,L.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.125-130, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

7. 228 Evaluation of a Compton scattering camera using 3D position-sensitive CdZnTe detectors

Du,Y.F. ; He,Z. ; Knoll,G.F. ; Wehe,D.K. ; Li,W.

Pub. info.:	Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado. pp.226-238, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3768

Conference Proceedings

8. Automatic extraction and visualization of object-oriented software design metrics

Lakshminarayana,A. ; Newman,T.S. ; Li,W. ; Talburt,J.

Pub. info.:	Visual data exploration and analysis VII : 24-26 January 2000, San Jose, California. pp.218-225, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3960

Conference Proceedings

9. WD13:Experimentat model of the sled system in optical disk drive

Han,J. ; Hock,K.M. ; Li,W. ; Chong,T.C. ; Shintani,K. ; Tong,K.L. ; Huang,C.-H. ; Rayaraj,R.

Pub. info.:	ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii. pp.279-281, 1999. Bellingham, Washington. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3864

10.

Conference Proceedings

10. Optical and electrical properties of a-Si1-xCx:H and ｦﾌc-Si1-xCx:H films perpared by using a methane and xylene source

Ma,T. ; Xu,J. ; Wang,L. ; Huang,X. ; Du,J. ; Li,W. ; Chen,K.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.446-450, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

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