1.
Conference Proceedings
Loh,S.W. ; Zhang,D.H. ; Li,C.Y. ; Liu,R. ; Wee,A.T.S.
Pub. info.:
Microelectronic Yield, Reliability, and Advanced Packaging . pp.176-182, 2000. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
4229
2.
Conference Proceedings
Narayanan,B. ; Li,C.Y. ; Lee,K. ; Yu,B. ; Wu,J.J. ; Foo,P.D. ; Xie,J.
Pub. info.:
Multilevel Interconnect Technology III . pp.42-45, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3883
3.
Conference Proceedings
Li,C.Y. ; Zhang,D.H. ; Qian,Y. ; Narayanan,B. ; Wu,J.J. ; Yu,B. ; Jiang,Z.X. ; Foo,P.D. ; Xie,J. ; Zhang,Q. ; Yoon,S.F.
Pub. info.:
Multilevel Interconnect Technology III . pp.46-49, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
3883