1.

Conference Proceedings
Conference Proceedings
1. The Impact of Rapid Thermal Annealing on the Properties of the Si (100)-SiO2 Interface
Hurley, P. K. ; Leveugle, C. ; Mathewson, A. ; Doyle, D. ; Whiston, S. ; Prendergast, J. ; Lundgren, P.
Pub. info.: Defect and impurity engineered semiconductors, II : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.659-,  1998.  Warrendale, Pa.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 510
2.

Conference Proceedings
Conference Proceedings
2. Large Contact Ti/4H-SiC Schottky Diodes Fabricated Using Standard Silicon Processing Techniques
Sudre, C. ; Mooney, M. ; Leveugle, C. ; O'Brien, J. ; Lane, W. A.
Pub. info.: Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999.  pp.1191-1194,  2000.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 338-342(2)