1.

Conference Proceedings

Conference Proceedings
Li, Q. ; Lei, H. ; Zuo, T.C.
Pub. info.: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.523-527,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4919
2.

Conference Proceedings

Conference Proceedings
Lei, H. ; Palla, S. ; Govindaraju, V.
Pub. info.: Applications of neural networks and machine learning in image processing IX : 19-20 January 2005, San Jose, California, USA.  pp.153-161,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5673
3.

Conference Proceedings

Conference Proceedings
Yang, R. ; Dai, B. ; Lei, H.
Pub. info.: Microwave remote sensing of the atmosphere and environment III : 24-25 October 2002, Hangzhou, China.  pp.464-478,  2003.  Bellingham, Wash.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4894
4.

Conference Proceedings

Conference Proceedings
Liu, J. ; Lu, Y. ; Su, G. ; Lei, H. ; Yang, Y.
Pub. info.: Rare earths '98 : proceedings of the International Conference on Rare Earths, held in Fremantle, Western Australia, October 25-30, 1998.  pp.525-529,  1999.  Zuerich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 315-317
5.

Conference Proceedings

Conference Proceedings
Smith, B. T. ; Lei, H. ; Kung, C.-C. ; Feng, D. ; Yin, J. ; Liang, H.
Pub. info.: Silicon Photonics.  pp.61250I-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6125
6.

Conference Proceedings

Conference Proceedings
Lei, H. ; Li, D. ; Liu, K. ; Zhang, C.
Pub. info.: International Conference on Space Information Technology.  pp.59852K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5985
7.

Conference Proceedings

Conference Proceedings
Chiou, S.Y. ; Lei, H. ; Liu, W.J. ; Chu, M.J. ; Chiang, D. ; Tuan, S. ; Hong, C.-L. ; Chang, M. ; Chen, J.-H. ; Chan, K.K. ; Qian, Q.-D. ; Cai, L. ; Pang, L.Y.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part One  pp.23-34,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689
8.

Conference Proceedings

Conference Proceedings
Fan, S. ; Hsu, M. ; Tseng, A. ; Chen, J.F. ; Van Den Broeke, D.J. ; Lei, H. ; Hsu, S. ; Shi, X.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part One  pp.221-231,  2002.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889