Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China. pp.523-527, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of neural networks and machine learning in image processing IX : 19-20 January 2005, San Jose, California, USA. pp.153-161, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Microwave remote sensing of the atmosphere and environment III : 24-25 October 2002, Hangzhou, China. pp.464-478, 2003. Bellingham, Wash. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Rare earths '98 : proceedings of the International Conference on Rare Earths, held in Fremantle, Western Australia, October 25-30, 1998. pp.525-529, 1999. Zuerich, Switzerland. Trans Tech Publications
Chiou, S.Y. ; Lei, H. ; Liu, W.J. ; Chu, M.J. ; Chiang, D. ; Tuan, S. ; Hong, C.-L. ; Chang, M. ; Chen, J.-H. ; Chan, K.K. ; Qian, Q.-D. ; Cai, L. ; Pang, L.Y.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.23-34, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering