Kraft, S. ; Collon, M. ; Guenther, R. ; Beijersbergen, M. W. ; Bavdaz, M. ; Lumb, D. H. ; Wallace, K. M. ; Peacock, A. ; Krumrey, M. ; Hoffmann, M. ; Muller, P. ; Lehmann, V.
Pub. info.:
Optics for EUV, x-ray, and gamma-ray astronomy II : 3-4 August 2005, San Diego, California, USA. pp.590010-590010, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Konz, W. ; Hildenbrand, J. ; Bauersfeld, M. ; Hartwig, S. ; Lambrecht, A. ; Lehmann, V. ; Wollenstein, J.
Pub. info.:
Smart sensors, actuators, and MEMS II : 9-11 May 2005, Seville, Spain. pp.540-548, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Proceedings of the International Symposium on Pits and Pores--Formation, Properties, and Significance for Advanced Luminescent Materials. pp.132-139, 1997. Pennington, NJ. Electrochemical Society
Proceedings of the Satellite Symposium to ESSDERC 93 Grenoble/France : crystalline defects and contamination: their impact and control in device manufacturing. pp.252-261, 1993. Pennington, NJ. Electrochemical Society
Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A.. pp.3-6, 1992. Pittsburgh, Pa.. Materials Research Society
Petrova-Koch, V. ; Kux, A. ; Muller, F. ; Muschik, T. ; Koch, F. ; Lehmann, V.
Pub. info.:
Light emission from silicon : symposium held December 3-5, 1991, Boston, Massachusetts, U.S.A.. pp.41-46, 1992. Pittsburgh, Pa.. Materials Research Society