1.

Conference Proceedings
Conference Proceedings
1. Multipoint process monitoring system based on an acousto-optic tunable filter (AOTF)
Kim,D. ; You,J.W. ; Kim,S.H. ; Kong,H.J. ; Lee,Y.W. ; Chegal,W. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.202-206,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings
Conference Proceedings
2. In-situ single-wavelength ellipsometer for a vacuum chamber
Chegal,W. ; Ye,S. ; Cho,H.M. ; Lee,Y.W. ; Kim,S.H. ; Kwak,Y.K.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.15-18,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
3.

Conference Proceedings
Conference Proceedings
3. MTF measurement of LCDs by a linear CCD imager: I. Monochrome case
Kim,T.H. ; Choe,O.S. ; Lee,Y.W. ; Cho,H.M. ; Lee,I.W.
Pub. info.: Optical manufacturing and testing II : 27-29 July 1997, San Diego, California.  pp.526-531,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3134
4.

Conference Proceedings
Conference Proceedings
4. Testing method of off-axis parabolic cylinder mirror for FIMS
Ryu,K.S. ; Edelstein,J. ; Song,J.B. ; Lee,Y.W. ; Chae,J.S. ; Seon,K.I. ; Yuk,I.S. ; Korpela,E.J. ; Seon,J.H. ; Nam,U.W. ; Han,W. ; Min,K.W.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.312-319,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
5.

Conference Proceedings
Conference Proceedings
5. A New Technique for Measuring Radius of Curvature Using Half-Aperture Bidirectional Shearing Interferometer,
Lee,Y.W. ; Cho,H.M. ; Shin,D.J. ; Chung,Y.B. ; Lee,I.W.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.225-226,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
6.

Conference Proceedings
Conference Proceedings
6. Equipment for Real Time MTF Testing of Copier and Fax Lenses,
Cho,H.M. ; Lee,Y.W. ; Chung,Y.B. ; Lee,I.W. ; Kim,T.H. ; Choe,O.S.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part1  pp.119-120,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
7.

Conference Proceedings
Conference Proceedings
7. Determination of microstructure-related optical constants of titanium dioxide thin films using optical methods
Kim,S.Y. ; Kim,H.J. ; Cho,H.M. ; Lee,Y.W.
Pub. info.: International Symposium on Polarization Analysis and Applications to Device Technology.  pp.234-237,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2873
8.

Conference Proceedings
Conference Proceedings
8. Neural net classification of liver ultrasonogram for quantitative evaluation of diffuse liver disease
Lee,D.H. ; Kim,J.H. ; Kim,H.C. ; Lee,Y.W. ; Min,B.G.
Pub. info.: Medical Imaging 1997: Image Processing.  Part2  pp.999-1004,  1997.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3034