Proceedings of the 15th International Modal Analysis Conference February 3-6, 1997 Sheraton World Resort Orlando, Florida. Part 2 pp.1614-1621, 1997. Bethel, CT. Society for Experimental Mechanics
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Optical Characterization Techniques for High-Performance Microelectronic Device Manufacturing III. pp.166-172, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering