1.

Conference Proceedings

Conference Proceedings
Park,H.-S. ; Kim,S.-Y. ; Lee,S.-W.
Pub. info.: Document recognition IV : 12-13 February, 1997, San Jose, California.  pp.40-49,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3027
2.

Conference Proceedings

Conference Proceedings
Bae,S.-G. ; Kim,Y.-K. ; Park,K.-Y. ; Kim,J.-S. ; Lee,W.-G. ; Lee,S.-W. ; Lee,D.-H.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.460-469,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
3.

Conference Proceedings

Conference Proceedings
Lee,S.-W. ; Lee,E.-J.
Pub. info.: Document recognition III : 29-30 January, 1996, San Jose, California.  pp.251-261,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2660
4.

Conference Proceedings

Conference Proceedings
Park,K.-C. ; Lee,T.-S. ; Kim,H.-N. ; Jeong,S.-Y. ; Ahn,S.-K. ; Kim,J.-Y. ; Lee,J.-S. ; Kim,J.-B. ; Lee,S.-W. ; Lee,D.-C. ; Asai,I.
Pub. info.: Optical data storage 2000 : 14-17 May, 2000, Whistler, Canada.  pp.43-47,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4090
5.

Conference Proceedings

Conference Proceedings
Jeong,C.-Y. ; Ryu,S. ; Park,K.-Y. ; Lee,W.G. ; Lee,S.-W. ; Lee,D.-H.
Pub. info.: Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA.  Part2  pp.818-826,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3999
6.

Conference Proceedings

Conference Proceedings
Park,K.-C. ; Kim,H.-N. ; Jeong,S.-Y. ; Ahn,S.-K. ; Lee,T.-S. ; Lee,S.-W. ; Lee,D.-C. ; Kim,J.-Y.
Pub. info.: ISOM/ODS '99 : joint international symposium on Optical Memory and Optical Data Strage 1999, 11-15 July 1999 Sheraton Kauai Resort, Koloa, Howaii.  Supplement  pp.416-418,  1999.  Bellingham, Washington.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3864
7.

Conference Proceedings

Conference Proceedings
Lee,S.-W. ; Cha,D.-H. ; Kim,D.-E.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.1226-1227,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
8.

Conference Proceedings

Conference Proceedings
Kim,D.-E. ; Lee,S.-W.
Pub. info.: Optics for science and new technology : 17th Congress of the International Commission for Optics, August 19-23, 1996, Hotel Riviera(Yusong), Taejon Korea.  Part2  pp.1224-1225,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2778
9.

Conference Proceedings

Conference Proceedings
Lee,S.-W. ; Shin,I.-G. ; Kim,Y.-H. ; Choi,S.-W. ; Han,W.-S. ; Yoon,H.-S. ; Sohn,J.-M.
Pub. info.: 17th European Conference on Mask Technology for Integrated Circuits and Microcomponents.  pp.32-36,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4349
10.

Conference Proceedings

Conference Proceedings
Lee,J.-Y. ; Cho,S.-Y. ; Kim,C.-H. ; Lee,S.-W. ; Choi,S.-W. ; Han,W.-S. ; Sohn,J.-M.
Pub. info.: 21st Annual BACUS Symposium on Photomask Technology.  4562  pp.609-615,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4562