Applications of digital image processing XXIV : 31 July - 3 August 2001, San Diego, USA. pp.555-566, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Mathematical modeling, Bayesian estimation, and inverse problems : 21-23 July 1999, Denver, Colorado. pp.172-182, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.190-198, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California. pp.781-790, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California. pp.179-189, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part2 pp.910-918, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA. Part2 pp.725-736, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.695-701, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering