1.

Conference Proceedings

Conference Proceedings
Lee,S.-J.
Pub. info.: Applications of digital image processing XXIV : 31 July - 3 August 2001, San Diego, USA.  pp.555-566,  2001.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4472
2.

Conference Proceedings

Conference Proceedings
Lee,S.-J.
Pub. info.: Mathematical modeling, Bayesian estimation, and inverse problems : 21-23 July 1999, Denver, Colorado.  pp.172-182,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3816
3.

Conference Proceedings

Conference Proceedings
Lee,J.-H. ; Kong,S.-C. ; Lee,S.-J. ; Choi,Y.-W.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.190-198,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
4.

Conference Proceedings

Conference Proceedings
Okoroanyanwu,U. ; Levinson,H.J. ; Romero,J. ; Singh,B. ; Lee,S.-J.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.781-790,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
5.

Conference Proceedings

Conference Proceedings
Kong,S.-C. ; Lee,J.-H. ; Lee,S.-J. ; Choi,Y.-W.
Pub. info.: Photodetectors : materials and devices V : 26-28 January 2000, San Jose, California.  pp.179-189,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3948
6.

Conference Proceedings

Conference Proceedings
Kong,S.-C. ; Lee,J.-H. ; Lee,S.-J. ; Cho,W.-S. ; Lim,Y.-S. ; Choi,Y.-W.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part2  pp.910-918,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
7.

Conference Proceedings

Conference Proceedings
Lee,S.-J. ; Lee,J.-H. ; Kong,S.-C. ; Choi,Y.-W.
Pub. info.: Physics and simulation of optoelectronic devices VIII : 24-28 January 2000, San Jose, USA.  Part2  pp.725-736,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3944
8.

Conference Proceedings

Conference Proceedings
Lee,S.-J. ; Fan,T.-J.
Pub. info.: Automated optical inspection for industry : 6-7 November 1996, Beijing, China.  pp.695-701,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2899
9.

Conference Proceedings

Conference Proceedings
Tsao,S.-L. ; Lee,S.-J.
Pub. info.: Organic photorefractives, photoreceptors, waveguides, and fibers : 21-23 July 1999, Denver, Colorado.  pp.322-332,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3799
10.

Conference Proceedings

Conference Proceedings
Lee,S.-J.
Pub. info.: Mathematical modeling, estimation, and imaging : 31 July - 1 August 2000, San Diego, USA.  pp.170-181,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4121