1.

Conference Proceedings

Conference Proceedings
Kim,H.-G. ; Kim,M.-S. ; Bok,C.-K. ; Park,B.-J. ; Kim,J.-W. ; Baik,K.-H. ; Lee,D.-H.
Pub. info.: Advances in resist technology and processing XV : 23-25 February 1998, Santa Clara, California.  Part 1  pp.554-561,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3333
2.

Conference Proceedings

Conference Proceedings
Yurchenko,I.A. ; Burstein,E. ; Lee,D.-H. ; KrotovV.
Pub. info.: International Conference on Optical Diagnosis of Materials and Devices for Opto-, Micro-, and Quantum Electronics : 13-15 May 1997, Kiev, Ukraine.  pp.202-212,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3359
3.

Conference Proceedings

Conference Proceedings
Lee,S.G. ; Seo,C.-K. ; Lee,D.-H. ; Lee,J.-U. ; Cho,M.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.795-802,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
4.

Conference Proceedings

Conference Proceedings
Bae,S.-G. ; Kim,Y.-K. ; Park,K.-Y. ; Kim,J.-S. ; Lee,W.-G. ; Lee,S.-W. ; Lee,D.-H.
Pub. info.: Metrology, inspection, and process control for microlithography XIV : 28 February - 2 March 2000, San Clara, California.  pp.460-469,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3998
5.

Conference Proceedings

Conference Proceedings
Jeong,C.-Y. ; Ryu,S. ; Park,K.-Y. ; Lee,W.G. ; Lee,S.-W. ; Lee,D.-H.
Pub. info.: Advances in resist technology and processing XVII : 28 February - 1 March 2000, Santa Clara, USA.  Part2  pp.818-826,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3999
6.

Conference Proceedings

Conference Proceedings
Lee,S.G. ; Kim,H.-J. ; Lee,D.-H. ; Lee,J.-U.
Pub. info.: Optical microlithography XIII : 1-3 March 2000, Santa Clara, USA.  Part1  pp.723-733,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4000
7.

Technical Paper

Technical Paper
Hwang,J. ; Lee,D.-H.
Pub. info.: A collection of technical papers : 17th AIAA Applied Aerodynamics Conference, Norfolk, Virginia 28 June-1 July, 1999.  pp.422-432,  1999.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Applied Aerodynamics Conference
Ser. no.: 1999
8.

Technical Paper

Technical Paper
Yee,K. ; Kim,Y. ; Lee,D.-H.
Pub. info.: A collection of technical papers : 17th AIAA Applied Aerodynamics Conference, Norfolk, Virginia 28 June-1 July, 1999.  pp.71-79,  1999.  Reston, VA.  American Institute of Aeronautics and Astronautics
Title of ser.: AIAA Paper : AIAA Applied Aerodynamics Conference
Ser. no.: 1999
9.

Conference Proceedings

Conference Proceedings
Lee,D.-H. ; Klein,M.E. ; Meyn,J.-P. ; Groヲツ,P. ; Marzenell,S. ; Wallenstein,R.E. ; Boller,K.-J.
Pub. info.: Nonlinear Materials, Devices, and Applications.  pp.25-36,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3928