1.

Conference Proceedings

Conference Proceedings
Lee,C.-H. ; Tsai,S.-H. ; Lin,C.-H. ; Maeda,R. ; Tsaur,J.-J. ; Fang,K.-J. ; Lu,J.-M. ; Lee,C. ; Fang,W.
Pub. info.: Design, test, integration, and packaging of MEMS/MOEMS 2001 : 25-27 April 2001, Cannes, France.  pp.486-493,  2001.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4408
2.

Conference Proceedings

Conference Proceedings
Lin,H.-P. ; Lee,C.-H. ; Lo,Y.-C. ; Lu,K.L.
Pub. info.: Optical microlithography XI : 25-27 February 1998, Santa Clara, California.  pp.986-996,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3334
3.

Conference Proceedings

Conference Proceedings
Lee,C.-H. ; Oh,H.-S. ; Lee,H.-K.
Pub. info.: Security and watermarking of multimedia contents II : 24-26 January 2000, San Jose, California.  pp.209-216,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3971
4.

Conference Proceedings

Conference Proceedings
Lee,C.-S. ; Lee,C.-H. ; Park,Y.-W. ; Ha,Y.-H.
Pub. info.: Color imaging : device-independent color, color hardcopy, and graphic arts IV : 26-29 January 1999, San Jose, California.  pp.541-550,  1998.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3648
5.

Conference Proceedings

Conference Proceedings
Weng,F.T. ; Lee,C.-H. ; Lu,K.-L. ; Chyn,Y.-P.
Pub. info.: Metrology, inspection, and process control for microlithography XII : 23-25 February 1998, San Clara, California.  pp.675-685,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3332
6.

Conference Proceedings

Conference Proceedings
Lee,C.-H. ; Lin,W.-J. ; Wang,J.
Pub. info.: Optical sensing, imaging, and manipulation for biological and biomedical applications : 26-28 July 2000, Taipei, Taiwan.  pp.125-133,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4082
7.

Conference Proceedings

Conference Proceedings
Lin,H.-P. ; Chang,C.-H. ; Lee,C.-H. ; Pang,S.L. ; Lu,K.L.
Pub. info.: Process, equipment, and materials control in integrated circuit manufacturing V : 22-23 September, 1999, Santa Clara, California.  pp.193-199,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3882
8.

Conference Proceedings

Conference Proceedings
Han,S.-K. ; Lee,C.-H. ; Sohn,S.-I.
Pub. info.: Integrated optics devices iv : 24-25 January, 2000, San Jose, California.  pp.58-65,  2000.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3936
9.

Conference Proceedings

Conference Proceedings
Lee,C.-H. ; Choi,W.-H. ; Lee,E.-J. ; Ha,Y.-H.
Pub. info.: Color imaging : device-independent color, color hardcopy, and graphic arts V : 25-28 January 2000, San Jose, California.  pp.415-422,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3963
10.

Conference Proceedings

Conference Proceedings
Oh,H.-S. ; Chang,D.-H. ; Lee,C.-H. ; Lee,H.-K.
Pub. info.: Security and watermarking of multimedia contents II : 24-26 January 2000, San Jose, California.  pp.536-544,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3971