1.

Conference Proceedings
Conference Proceedings
1. Evaluation of SOI wafers using C-V characteristics of thin-film MOS capacitor
Lee, J.W. ; Yang, J.W. ; Lee, W.C. ; Oh, M.R. ; Koh, Y.H.
Pub. info.: Proceedings of the Eighth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.179-184,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-23
2.

Conference Proceedings
Conference Proceedings
2. FLUX PINNING DEFECTS INDUCED BY ELECTRON IRRADIATION IN Y1Ba2Cu3O7-δ SINGLE CRYSTALS
Giapintzakis, J. ; Kirk, M.A. ; Lee, W.C. ; Rice, J.P. ; Ginsberg, D.M. ; Robertson, I.M. ; Wheeler, R.
Pub. info.: Layered superconductors : fabrication, properties, and applications : symposium held April 27-May 1, 1992, in San Francisco, California, U.S.A..  pp.741-746,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 275