1.

Conference Proceedings
Conference Proceedings
1. Direct Determination of Effect of SOI Defects on GOI Characteristics
Lee, W-H ; Lee, J-W ; Kim, H-K ; Oh, M-R ; Koh, Y-H
Pub. info.: Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.179-183,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-3
2.

Conference Proceedings
Conference Proceedings
2. Hot-Carrier Degradation Behavior in Thin-Film SOT nMOSFETs With LOCOS and STI
Lee, J-W ; Kim, H-K ; Lee, W-H ; Oh, M-R ; Kob, Y-H
Pub. info.: Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.282-286,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-3
3.

Conference Proceedings
Conference Proceedings
3. Effect of Buried Oxide on Reliability of Thin-Film SOI nMOSFETs
Kim, H-K ; Lee, J-W ; Lee, W-H ; Oh, M-R ; Koh, Y-H
Pub. info.: Proceedings of the Ninth International Symposium on Silicon-on-Insulator Technology and Devices.  pp.255-259,  1999.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 99-3