Advances in laboratory-based X-ray sources and optics III : 8 July, 2002, Seattle, Washington, USA. pp.77-86, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, S.M. ; Fleury, E. ; Kim, J.S. ; Kim, Y.C. ; Kim, D.H. ; Kim, W.T. ; Ahn, H.S.
Pub. info.:
Quasicrystals-preparation, properties and applications : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Quasicrystals-preparation, properties and applications : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A.. 2001. Warrendale, Pa.. Materials Research Society
Ku, J.N. ; Yoon, E.Y. ; Won, J.H. ; Song, I.J. ; Chang, D.H. ; Hwang, S.M. ; Park, M.K. ; Bang, D.S. ; Um, M.S. ; Park, S.M. ; Lee, S.M. ; Jang, D.H.
Pub. info.:
Optical components and transmission systems : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-18 October, 2002, Shanghai, China. pp.107-115, 2002. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Superplasticity in advanced materials, ICSAM-2000 : proceedings of the 2000 International Conference on Superplasticity in Advanced Materials (ICSAM-2000) held at Sheraton International Resort, Orlando [Florida], USA during August 1-4, 2000. pp.321-326, 2001. Uetikon-Zuerich, Switzerland. Trans Tech Publications
ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004. pp.3410-3413, 2004. Brookfield Center, Conn.. Society of Plastics Engineers
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
ANTEC 2004, 62nd annual technical conference, Chicago, IL, May 16-20, 2004. pp.3414-3417, 2004. Brookfield Center, Conn.. Society of Plastics Engineers
Title of ser.:
Annual Technical Conference - ANTEC : Society of Plastics Engineers Annual Technical Papers
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.940-948, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering