1.

Conference Proceedings
Conference Proceedings
1. LITHIUM ION TRANSPORT CHARACTERISTICS THROUGH THE LICOO 2 THIN-FILM CATHODE AS A FUNCTION OF ITS THICKNESS
Lee, J.-K. ; Lee, S.-J. ; Lee, H.-K.S.-M.
Pub. info.: Micro power sources : proceedings of the international symposium.  pp.81-88,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-3
2.

Conference Proceedings
Conference Proceedings
2. EFFECTS OF HYDROGEN PLASMA TREATMENT ON HYDROGENATED AMORPHOUS SILICON
Lee, J.-K. ; Schiff, E.A.
Pub. info.: Amorphous silicon technology, 1992.  pp.185-190,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 258
3.

Conference Proceedings
Conference Proceedings
3. Novel non-lithographic large area fabrication method to generate various polymeric nanostructures
W. Lee, ; M.-K. Jin, ; W.-C. Yoo, ; Lee, J.-K.
Pub. info.: Nanotechnology in mesostructured materials : proceedings of the 3rd International Mesostructured Materials Symposium, Jeju, Korea, July 8-11, 2002.  pp.85-88,  2003.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 146
4.

Conference Proceedings
Conference Proceedings
4. EFFECTS OF TEMPERATURE AND CHARGE DEPLETION ON THE SPIN DENSITY IN HYDROGENATED AMORPHOUS SILICON
Lee, J.-K. ; Schiff, E.A.
Pub. info.: Amorphous silicon technology 1991 : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A..  pp.605-610,  1991.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 219
5.

Conference Proceedings
Conference Proceedings
5. Evaluation of EA-PSM opaque repair on 90-nm lithography
Kim, D.-W. ; Lee, J.-K. ; Koo, S.H. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.-S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.484-495,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
6.

Conference Proceedings
Conference Proceedings
6. Detection capability for chrome defect of tri-tone PSM
Lee, J.-K. ; Kim, D.-W. ; Shin, K.-M. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.-S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology X.  pp.439-445,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5130
7.

Conference Proceedings
Conference Proceedings
7. Comparative evaluation of mask production CAR development processes with stepwise defect inspection
Jeong, W.-G. ; Lee, J.-K. ; Park, D.I. ; Park, E.-S. ; Lee, J.-H. ; Seo, S.-K. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.S. ; Jeong, S.H.
Pub. info.: 22nd Annual BACUS Symposium on Photomask Technology.  Part One  pp.626-633,  2002.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4889
8.

Conference Proceedings
Conference Proceedings
8. Luminescence of Er-doped amorphous silicon quantum dots
Park, N.-M. ; Kim, T.-Y. ; Kim, S.H. ; Sung, G.Y. ; Kim, B.-H. ; Park, S.-J. ; Cho, K.S. ; Shin, J.H. ; Lee, J.-K. ; Nastasi, M.
Pub. info.: Quantum Dots, Nanoparticles, and Nanoclusters.  pp.60-65,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5361
9.

Conference Proceedings
Conference Proceedings
9. The judgment criteria of halftone pinhole defects
Shin, K.M. ; Kim, D.-W. ; Lee, J.-K. ; Lee, D.-H. ; Kim, J.-M. ; Choi, S.-S.
Pub. info.: Photomask and Next-Generation Lithography Mask Technology XI.  pp.330-341,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5446