Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA. pp.586913-586914, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Design, test, integration, and packaging of MEMS/MOEMS 2002 : 6-8 May, 2002, Cannes, France. pp.183-190, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XXVII : 2-6 August 2004, Denver, Colorado, USA. pp.191-201, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Metro and access networks II : APOC 2002 : Asia-Pacific Optical and Wireless Communications : 16-17 October, 2002, Shanghai, China. pp.201-210, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
APOC 2001: Asia-Pacific Optical and Wireless Communications : Optoelectronics, Materials, and Dvices for Communications : 13-15 November 2001, Beijing, Chaina. pp.124-130, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Device and process technologies for MEMS and Microelectronics II : 17-19 December 2001, Adelaide, Australia. pp.428-435, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Lee, J.-H. ; Li, S.S. ; Tidrow, M. ; Liu, W.K. ; Bacher, K.
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Advanced luminescent materials and quantum confinement : proceedings of the international symposium. pp.436-446, 1999. Pennington, NJ. Electrochemical Society
Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA. pp.131-141, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Lim, G. ; Kim, T.E. ; Lee, J.-H. ; Kim, I. ; Lee, H-W.
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Thin film materials, processes, and reliability, plasma processing for the 100 nm node and copper interconnects with low-k inter-level dielectric films : proceedings of the international symposium. pp.266-271, 2003. Pennington, N.J.. Electrochemical Society
APOC 2001: Asia-Pacific Optical and Wireless Communications : wireless and mobile communications : 12-15 November 2001, Beijing, China. pp.134-143, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering